Thursday, May 24, 2012, 16:00
WHGA/001
M. Doebeli, ETH
Abstract:
Elastic scattering cross-sections of MeV charged particles can be
calculated easily with sub-percent accuracy. Due to the continuous
energy
loss of ions in mater it is also possible to determine at what depth the
scattering took place. In addition, particle beams can be focused to
sub-micron spot sizes. These are the main reasons why MeV ion beams are
still competitively used for analytical purposes even 104 years after
Rutherfords Nobel prize. The application of Rutherford backscattering,
elastic recoil detection, particle induced X-ray emission, and nuclear
reactions in modern materials analysis will be explained and the
accelerator facilities at ETH Zurich and their availability to the PSI
community will be presented.